Direct determination of the absolute electron density of nanostructured and disordered materials at sub-10-nm resolution

Physical Review B - Condensed Matter and Materials Physics

Volumn 68, Issue 1, 2003, Pages 122011-122013

  Miao, Jianwei ^a   Amonette, James E ^b   Nishino, Yoshinori ^c   Ishikawa, Tetsuya ^c   Hodgson, Keith O ^a,d  

^a SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^b PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

^c RIKEN   (Japan)

^d STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

NITROGEN; SILICON DIOXIDE;

ARTICLE; ELECTRON DIFFRACTION; ELECTRON TRANSPORT; ILLUMINATION; INFRARED SPECTROSCOPY; NANOPARTICLE; OPTICAL RESOLUTION; QUANTITATIVE ANALYSIS; RADIODENSITOMETRY; SPECTRAL SENSITIVITY; STRUCTURE ANALYSIS; SYNCHROTRON; TEMPERATURE DEPENDENCE; X RAY CRYSTALLOGRAPHY; X RAY DIFFRACTION;

EID: 0141651998     PISSN: 01631829     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (20)

1. Nanotechnology Research Directions: IWGN Workshop Report-Vision for Nanotechnology R&D in the next decade, the National Science and Technology Council's IWGN workshop (1999).
2. S. Spector, C. Jacobsen, and D. Tennant, J. Vac. Sci. Technol. B 15, 2872 (1997).
3. W. Yun et al., Rev. Sci. Instrum. 70, 2238 (1999).
4. D. Sayre, H. N. Chapman, and J. Miao, Acta Crystallogr., Sect. A: Found. Crystallogr. 54, 232 (1998).
5. J. Miao, P. Charalambous, J. Kirz, and D. Sayre, Nature (London) 400, 342 (1999).
6. I. K. Robinson, I. A. Vartanyants, G. J. Williams, M. A. Pferfer, and J. A. Pitney, Phys. Rev. Lett. 87, 195505 (2001).
7. J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai, and K. O. Hodgson, Phys. Rev. Lett. 89, 088303 (2002).
8. U. Weierstall, Q. Chen, J. C. H. Spence, M. R. Howells, M. Isaacson, and R. P. Panepucci, Ultramicroscopy 90, 171 (2002).
9. J. Miao, K. O. Hodgson, T. Ishikawa, C. A. Larabell, M. A. LeGros, and Y. Nishino, Proc. Natl. Acad. Sci. U.S.A. 100, 110 (2003).
10. G. J. Williams, M. A. Pfeifer, I. A. Vartanyants, and I. K. Robinson, Phys. Rev. Lett. 90, 175501 (2003).
11. H. He, S. Marchesini, M. Howells, U. Weierstall, G. Hembree, and J. C. H. Spence, Acta Crystallogr., Sect. A: Found. Crystallogr. 59, 143 (2003).
12. K. Tamasaku, M. Yabashi, H. Yamazaki, N. Kawamura, M. Suzuki, and T. Ishikawa, Nucl. Instrum. Methods Phys. Res. A 467-468, 686 (2001).
13. The sample, silica materials with a 15-nm pore size obtained from Aldrich Chemicals (product No. 23,684-5, Silica-gel, Davisil), was ground gently while wet for about 5 min using a mortar and pestle. A portion of 100 mg of ground sample was mixed with 45 mL of water in a conical bottomed centrifuge tube. The tube was shaken by hand to disperse the particles and then centrifuged at 3000 rpm for 9 min using a Beckman GS-15 centrifuge and an angle-head rotor. After centrifugation, the top 40 mL of supernate were removed and then freeze dried to minimize aggregate formation. The silica particles were then dispersed in alcohol and picked up on silicon nitride membranes. The silicon nitride membranes were examined under a light microscope and well isolated porous silica particles with a size of ∼2 μm were chosen for the study.
14. J. Miao, T. Ishikawa, E. H. Anderson, and K. O. Hodgson, Phys. Rev. B 67, 174104 (2003).
15. J. Kirz, C. Jacobsen, and M. Howells, Q. Rev. Biophys. 28, 33 (1995).
16. S. M. Gruner, M. W. Tate, and E. F. Eikenberry, Rev. Sci. Instrum. 73, 2815 (2002).
17. J. Miao, D. Sayre, and H. N. Chapman, J. Opt. Soc. Am. A 15, 1662 (1998).
18. 2.
19. http://ssrl.slac.stanford.edu/lcls.
20. http://erl.chess.cornell.edu.