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Volumn 8, Issue 1, 2008, Pages 310-316

Single particle X-ray diffractive imaging

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTIVE IMAGING; ELECTROSPRAYGENERATED PARTICLES; NANOSCALE OBJECTS; SINGLE-SHOT IMAGING; X-RAY PULSES;

EID: 38749088980     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl072728k     Document Type: Article
Times cited : (247)

References (38)
  • 6
  • 18
    • 0142101708 scopus 로고    scopus 로고
    • Real-time single-particle analysis
    • Baron, P. A, Willeke, K, eds, John Wiley & Sons: Hoboken, NJ
    • Wexler, A. S.; Johnston, M. V. Real-time single-particle analysis. In Aerosol Measurement; Baron, P. A., Willeke, K., eds.; John Wiley & Sons: Hoboken, NJ, 2005; pp 365-386.
    • (2005) Aerosol Measurement , pp. 365-386
    • Wexler, A.S.1    Johnston, M.V.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.