SCOPUS 정보 검색 플랫폼

Volumn 100, Issue 2, 2008, Pages

Nanoscale imaging of buried structures with elemental specificity using resonant X-ray diffraction microscopy

(10) Song, Changyong a Bergstrom, Raymond a Ramunno Johnson, Damien a Jiang, Huaidong a Paterson, David b De Jonge, Martin D c McNulty, Ian c Lee, Jooyoung a Wang, Kang L a Miao, Jianwei a

a UNIVERSITY OF CALIFORNIA (United States)

b AUSTRALIAN SYNCHROTRON (Australia)

c ARGONNE NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION PATTERNS; MAGNETIC MATERIALS; PIXELS; SEMICONDUCTOR MATERIALS; X RAY DIFFRACTION;

BIOMINERALS; BURIED STRUCTURES; ELECTRONIC RESONANCES; ORGANIC MATERIALS;

IMAGE ANALYSIS;

EID: 38349171892 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.100.025504 Document Type: Article

Times cited : (70)

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