Quantitative image reconstruction of GaN quantum dots from oversampled diffraction intensities alone

Physical Review Letters

Volumn 95, Issue 8, 2005, Pages

  Miao, Jianwei ^a   Nishino, Yoshinori ^b   Kohmura, Yoshiki ^b   Johnson, Bart ^c   Song, Changyong ^a   Risbud, Subhash H ^d   Ishikawa, Tetsuya ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b RIKEN   (Japan)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^d University of California   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION INTENSITIES; GAN QUANTUM DOTS; MISSING DATA PROBLEM;

DIFFRACTION; ELECTRONS; MICROSCOPIC EXAMINATION; SEMICONDUCTOR QUANTUM DOTS; X RAY ANALYSIS;

IMAGE RECONSTRUCTION;

EID: 27144542667     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.95.085503     Document Type: Article

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