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Applied Physics Express

Volumn 2, Issue 7, 2009, Pages

The dynamics of electromigration in copper nanocontacts

(2) Kizuka, Tokushi a Aoki, Hisanori a

a UNIVERSITY OF TSUKUBA (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

IN-SITU TRANSMISSION; NANOCONTACTS;

IN SITU PROCESSING; TRANSMISSION ELECTRON MICROSCOPY;

ELECTROMIGRATION;

EID: 68249128445 PISSN: 18820778 EISSN: 18820786 Source Type: Journal
DOI: 10.1143/APEX.2.075003 Document Type: Article

Times cited : (18)

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