An efficient method to identify critical gates under circuit aging

IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD

Volumn , Issue , 2007, Pages 735-740

  Wang, Wenping ^a   Wei, Zile ^b   Yang, Shengqi ^c   Cao, Yu ^a  

^a Arizona State University   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHLORINE COMPOUNDS; DEGRADATION; DESIGN; DIGITAL CIRCUITS; FIELD EFFECT TRANSISTORS; INTEGRATED CIRCUIT TESTING; KETONES; NEGATIVE TEMPERATURE COEFFICIENT; NETWORKS (CIRCUITS); PROBABILITY; RANDOM PROCESSES; RISK ASSESSMENT; SULFATE MINERALS; THERMODYNAMIC STABILITY; TIME MEASUREMENT; TIMING CIRCUITS;

65-NM NODES; BENCHMARK CIRCUITS; CIRCUIT PERFORMANCES; COMPUTER-AIDED DESIGN; CRITICAL PATHS; DEGRADATION RATES; DESIGN TECHNIQUES; EFFICIENT METHODS; INTERNATIONAL CONFERENCES; NEGATIVE BIAS- TEMPERATURE-INSTABILITY; OPERATING CONDITIONS; RELATIVE IMPORTANCE; SIGNAL PROBABILITY; TIME ANALYSIS; TIMING ANALYSIS; WORST CASE;

CRITICAL PATH ANALYSIS;

EID: 49549122051     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2007.4397353     Document Type: Conference Paper

References (19)

1. Berkeley logic synthesis and verification group, abc: A system for sequential synthesis and verification, release 61225. available at: http://www.eecs.berkeley.edu/alanmi/abc/, Dec. 2006.
2. M. Agarwal. B. C. Paul, M. Zhang, and S. Mitra. Circuit failure prediction and its application to transistor aging. IEEE VLSI Test Symp., pages 277-286, 2007.
3. M. A. Alam and S. Mahapatra. A comprehensive model of PMOS NBTI degradation. Microelectronics Reliability, 45:71-81, Aug. 2005.
4. S. Bhardwaj, W. Wang, R. Vattikonda, Y. Cao, and S. Vrudhula. Predictive modeling of the nbti effect for reliable design. CICC, pages 189-192, Sep. 2006.
5. S. Borkar. Electronics beyond nano-scale CMOS. ACM/IEEE DAC, pages 807-808, 2006.
6. E. M. Sentovich, K. J. Singh, L. Lavagno, C. Moon, R. Murgai, A. Saldanha, H. Savoj, P. R. Stephan, R. K. Brayton and A. Sangiovanni-Vincentelli. SIS: A system for sequential circuit synthesis. Technical report, 1992.
7. http://courses.ece.uiuc.edu/ece543/iscas85.html/.
8. http://www.cbl.ncsu.edu/.
9. http://www.cerc.utexas.edu/itc99-benchmarks/bench.html.
10. B. Krishnamurthy and I. G. Tollis. Improved techniques for estimating signal probabilities. IEEE Tran. on Computers, 38(7):1041-1045, Jul. 1989.
11. A. T. Krishnan. C. Chancellor, S. Chakravarthi, P. E. Nicollian. V. Reddy, and A. Varghese. Material dependence of hydrogen diffusion: Implication for nbti degradation. IEDM. Dec. 2005.
12. S. V. Kumar, C. H. Kim, and S. S. Sapatnekar. An analytical model for negative bias temperature instability. ICCAD, pages 493-496, 2006.
13. B. C. Paul. K. Kang, H. Kufluoglu, M. A. Alam, and K. Roy. Temporal performance degradation under NBTI: Estimation and design for improved reliability of nanoscale circuits. DATE, pages 780-785. 2006.
14. V. Reddy, A. T. Krishnan, A. Marshall, J. Rodriguez. S. Natarajan, T. Rost, and S. Krishnan. Impact of negative bias temperature instability on digital circuit reliability. IRPS, pages 248-254. Apr. 2002.
15. T. Sakurai and A. R. Newton. Alpha-power law mosfet model and its application to cmos inverter delay and other formulas. JSSC, 25(2):584-594, Apr. 1990.
16. D. K. Schroder and J. A. Babcock. Negative bias temperature instability: Road to cross in deep submicron silicon semiconductor manufacturing. Journal of Applied Physics, 94(1): 1-18. Jul. 2003.
17. R. Vattikonda, W. Wang, and Y. Cao. Modeling and minimization of pinos nbti effect for robust nanometer design. DAC, pages 1047-1052, Jul. 2006.
18. W. Wang, S. Yang, S. Bhardwaj, R. Vattikonda, S. Vrudhula, F. Liu, and Y. Cao. The impact of nbti on the performance of combinational and sequential circuits. DAC, pages 364-369, Jun. 2007.
19. W. Zhao and Y. Cao. New generation of predictive technology model for sub-45nm early design explorations, available at http://www.eas.asu.edu/ ~ptm. TED, 53(11):2816-2823, Nov. 2006.