A study of background signals in terahertz apertureless near-field microscopy and their use for scattering-probe imaging

Journal of Applied Physics

Volumn 105, Issue 11, 2009, Pages

  Astley, Victoria ^a   Zhan, Hui ^a   Mendis, Rajind ^a   Mittleman, Daniel M ^a  

^a Rice University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APERTURELESS NEAR-FIELD MICROSCOPY; BACKGROUND SIGNALS; BROAD BANDWIDTHS; EVANESCENT WAVE; FREE SPACE; MEASURED SIGNALS; METAL TIP; PATH LENGTH; PHASE-SENSITIVE; PHASE-SENSITIVE DETECTION; PROBE TIPS; SCATTERED RADIATIONS; SPATIAL RESOLUTION; SPATIAL VARIATIONS; SUB-WAVELENGTH; SUBWAVELENGTH RESOLUTION; TERA HERTZ; TERAHERTZ REGION; TERAHERTZ SOURCES; TERAHERTZ WAVES; TIP-SAMPLE DISTANCE;

ANTENNAS; IMAGING TECHNIQUES; METAL RECOVERY; MODULATION; PROBES; SCATTERING; SPACE PROBES;

SIGNAL DETECTION;

EID: 67649560604     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3141727     Document Type: Article

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