THz near-field imaging

Optics Communications

Volumn 150, Issue 1-6, 1998, Pages 22-26

  Hunsche, S ^a   Koch, M ^b   Brener, I ^a   Nuss, M C ^a  

^a LUCENT TECHNOLOGIES   (United States)

^b UNIVERSITY OF MUNICH   (Germany)

Author keywords

Far infrared microscopy; Near field microscopy; THz imaging; Ultrafast technology

Indexed keywords

IMAGE QUALITY; ULTRAFAST PHENOMENA;

FAR INFRARED MICROSCOPY; NEAR FIELD MICROSCOPY;

OPTICAL MICROSCOPY;

EID: 0032073827     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(98)00044-3     Document Type: Article

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