Spot-size reduction in terahertz apertureless near-field imaging

Optics Letters

Volumn 29, Issue 19, 2004, Pages 2306-2308

  Planken, P C M ^a   Van Der Valk, N G J ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ANTENNA EFFECTS; APERTURELESS NEAR FIELD SCANNING OPTICL MICROSCOPY (ANSOM); MODULATION FREQUENCY; NEAR-FIELD IMAGING;

COMPUTATIONAL METHODS; CRYSTALS; FREQUENCIES; LASER PULSES; LIGHT MODULATION; OPTICAL RESOLVING POWER; OPTICAL SWITCHES; PHOTOCONDUCTIVITY;

IMAGING TECHNIQUES;

EID: 6444228039     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.29.002306     Document Type: Article

References (8)

1. N. C. J. van der Valk and P. C. M. Planken, Appl. Phys. Lett. 81, 1558 (2002).
2. K. Wang, A. Barkan, and D. M. Mittleman, Appl. Phys. Lett. 84, 305 (2004).
3. H.-T. Chen, R. Kersting, and G. C. Cho, Appl. Phys. Lett. 83, 3009 (2003).
4. B. Knoll and F. Keilmann, Opt. Commun. 182, 321 (2000).
5. R. Hillenbrand, T. Taubner, and F. Keilmann, Nature 418, 159 (2002).
6. R. Fikri, T. Grosges, and D. Barchiesi, Opt. Lett. 28, 2147 (2003).
7. C. A. Balanis, Antenna Theory, Analysis and Design, 2nd ed. (Wiley, New York, 1997).
8. P. C. M. Planken and N. C. J. van der Valk are preparing a manuscript called "Measurement and calculation of the near field of a terahertz apertureless scanning optical microscope" for submission to J. Opt. Soc. Am. B.