Terahertz near-field microscopy based on a collection mode detector

Applied Physics Letters

Volumn 77, Issue 22, 2000, Pages 3496-3498

  Mitrofanov, O ^a,b   Brener, I ^b,c   Harel, R ^b   Wynn, J D ^b   Pfeiffer, L N ^b   West, K W ^b   Federici, J ^a  

^a NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

^b LUCENT TECHNOLOGIES   (United States)

^c Tellium Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000465053     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1328772     Document Type: Article

References (13)

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