Near-field microscope probe for far infrared time domain measurements

Applied Physics Letters

Volumn 77, Issue 4, 2000, Pages 591-593

  Mitrofanov, O ^a,b   Brener, I ^b   Wanke, M C ^b   Ruel, R R ^b   Wynn, J D ^b   Bruce, A J ^b   Federici, J ^a  

^a NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

^b LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001493379     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.127054     Document Type: Article

References (19)

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