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Volumn 16, Issue 5, 2008, Pages 3430-3438
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Spectroscopic THz near-field microscope
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
BROADBAND NETWORKS;
DEMODULATION;
GOLD;
OPTIMIZATION;
SCATTERING;
ASYNCHRONOUS OPTICAL SAMPLING;
THZ NEAR-FIELD MICROSCOPE;
NEAR FIELD SCANNING OPTICAL MICROSCOPY;
DIAGNOSTIC AGENT;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
EQUIPMENT;
EQUIPMENT DESIGN;
IMAGE ENHANCEMENT;
INSTRUMENTATION;
MICROWAVE RADIATION;
SPECTROSCOPY;
EQUIPMENT DESIGN;
EQUIPMENT FAILURE ANALYSIS;
IMAGE ENHANCEMENT;
MICROSCOPY, ATOMIC FORCE;
MICROWAVES;
SPECTRUM ANALYSIS;
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EID: 40349094713
PISSN: None
EISSN: 10944087
Source Type: Journal
DOI: 10.1364/OE.16.003430 Document Type: Article |
Times cited : (139)
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References (45)
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