Analytical analysis of modulated signal in apertureless scanning near-field optical microscopy

Optics Express

Volumn 15, Issue 24, 2007, Pages 15782-15796

  Chuang, C H ^a   Lo, Y L ^a  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Apertureless scanning near field optical microscopy; Signal analysis

Indexed keywords

BESSEL FUNCTIONS; OPTICAL MICROSCOPY; PHASE MODULATION; SIGNAL DETECTION; WAVELENGTH;

BACKGROUND-NOISE DECAYS; HARMONIC FREQUENCIES; MODULATION FREQUENCY;

SIGNAL ANALYSIS;

EID: 36749010159     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.015782     Document Type: Article

References (19)

1. E. H. Synge, "A suggested method for extending the microscopic resolution into the ultramicroscopic region," Phil. Mag. 6, 356-362 (1928).
2. G. Binnig and H. Rohrer, "Scanning tunneling microscopy," HeIv. Phys. Acta. 55, 726-735 (1982).
3. G. Binnig, C. F. Quale, and C Gerber, "Atomic force miscopy," Phys. Rev. Lett., 56, 930-933 (1986).
4. D. W. Pohl, S. Denk, and M. Lanz, "Optical stethoscopy: image recording with resolutionλ/20 ," J' Appl. Phys. 44, 651-653(1984).
5. J. D. Jackson, Classical electrodynamics (Wiley, 1999).
6. J. Wessel, "Surface-enhanced optical microscopy," J. Opt. Soc. Am. 2, 1538-1540 (1985).
7. H. K. Wickramasinghe and C. C. Williams, "Apertureless near field optical microscope," US Patent 4 947 034 (1990).
8. Y. Inouye and S. Kawata, "Near-field scanning optical, microscope with a metallic probe tip," Opt. Lett. 19, 159-161 (1994).
9. B. Knoll and F. Keilmann, "Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy," Opt. Commun. 182, 321-328 (2000).
10. R. Hillenbrand and F. Keilmann, "Complex optical constants on a subwavelength scale," Phys. Rev. Lett. 85, 3029-3032 (2000).
11. R. Hillenbrand B. Knoll, and F. Keilmann, "Pure optical contrast, in scattering-type scanning near-field microscopy," J. Microsc. 202, 77-83 (2000).
12. I. Stefanon, S. Blaize, A. Bruyant, S Aubert, G. Lerondel, R. Bachelot, and P. Royer, "Heterodyne detection of guided waves using a scattering-type scanning near-field optical microscope," Opt. Express 13, 5553-5564 (2005).
13. F. Keilmann and R. Hillenbrand, "Near-field microscopy by elastic light scattering from a tip," Phil. Trans. R. Soc. Lond. A. 362, 787-805 (2004).
14. J. N. Walford, J. A. Porto, R. Carminad, J. J. Greifet, P. M. Adam, S. Hudlet, J. L. Bijeon, A. Stashkevich, and P. Royer, "Influence of tip modulation on image formation in scanning near-field optical microscopy," J. Appl. Phys. 89, 5159-5169 (2001).
15. S. Hudlet, S. Aubert, A. Bruyant, R. Bachelot, P. M. Adam, J. L. Bijeon, G. Lerondel, P. Royer, and A. A. Stashkevich, "Apertureless near field optical microscopy: a contribution to the understanding of the signal detected in the presence of background field," Opt. Commun. 230, 245-251( 2004).
16. P. G. Gucciardi, G. Bachelier, and M. Allegrini, "Far-field background suppression in tip-modulated apertureless near-field optical microscopy," J. Appl, Phys. 99, Art. No. 124309 (2006).
17. Y.L Lo and C.H. Chuang, "New synthetic-heterodyne demodulation for an optical fiber interferometry," IEEE J. Quantum Electro. 37, 658-663 (2001).
18. M. Mieic, N. Klymyshyn, Y. D. Sun, and H. P. Lu, "Finite element method simulation of the field distribution for AFM tip-enhanced surface Raman Scanning Microscopy," J. Phys. Chem. B. 107, 1574-1584 (2003).
19. A. Bek, Apertureless SNOM: a new tool for nano-optics, (Ph.D. Thesis, Max Planck Institute for Solid State Research, Germany, 2004).