Experimental demonstration for scanning near-field optical microscopy using a metal micro-slit probe at millimeter wavelengths

Applied Physics Letters

Volumn 71, Issue 24, 1997, Pages 3581-3583

  Bae, Jongsuck ^a,b   Okamoto, Tatsuya ^a   Fujii, Tetsu ^a   Mizuno, Koji ^a,b   Nozokido, Tatsuo ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001027956     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120397     Document Type: Article

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