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Volumn 9, Issue 5, 2009, Pages 1866-1871

Charge transport in interpenetrating networks of semiconducting and metallic carbon nanotubes

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOTUBE NETWORK; CHARGE TRANSPORT; ELECTRIC FORCE MICROSCOPY; ELECTRONIC PHASE DIAGRAM; GATING MECHANISMS; INTERPENETRATING NETWORKS; LOW COSTS; MACROELECTRONICS; METALLIC CARBON NANOTUBES; METALLIC TUBES; SCHOTTKY BARRIERS; SEMICONDUCTING TUBES; VOLTAGE DROP;

EID: 66449120187     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl803849e     Document Type: Article
Times cited : (149)

References (46)
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  • 15
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    • Collins, P. G. Science 2000, 287 (5459), 1801.
    • (2000) Science , vol.287 , Issue.5459 , pp. 1801
    • Collins, P.G.1
  • 32
    • 66449097709 scopus 로고    scopus 로고
    • Local Resistance of Single-Walled Carbon Nanotubes As Measured by Scanning Probe Techniques
    • Popov, V. N, Lambin, P, Eds, Springer Netherlands: Dordrecht, The Netherlands
    • Goldsmith, B.; Collins, P. Local Resistance of Single-Walled Carbon Nanotubes As Measured by Scanning Probe Techniques. In Carbon Nanotubes; Popov, V. N., Lambin, P., Eds.; Springer Netherlands: Dordrecht, The Netherlands, 2006; Vol. 222, pp 179-180.
    • (2006) Carbon Nanotubes , vol.222 , pp. 179-180
    • Goldsmith, B.1    Collins, P.2
  • 33
    • 66449128260 scopus 로고    scopus 로고
    • Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices
    • Kalinin, S, Gruverman, A, Eds, Springer New York: New York
    • Staii, C.; Radosavljevic, M.; Johnson, A. Scanning Probe Microscopy of Individual Carbon Nanotube Quantum Devices. In Scanning Probe Microscopy; Kalinin, S., Gruverman, A., Eds.; Springer New York: New York, 2007; pp 423-439.
    • (2007) Scanning Probe Microscopy , pp. 423-439
    • Staii, C.1    Radosavljevic, M.2    Johnson, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.