Transparent conductive single-walled carbon nanotube networks with precisely tunable ratios of semiconducting and metallic nanotubes

ACS Nano

Volumn 2, Issue 6, 2008, Pages 1266-1274

  Blackburn, Jeffrey L ^a   Barnes, Teresa M ^a   Beard, Matthew C ^a   Kim, Yong Hyun ^a   Tenent, Robert C ^a   McDonald, Timothy J ^a   To, Bobby ^a   Coutts, Timothy J ^a   Heben, Michael J ^a  

^a NATIONAL RENEWABLE ENERGY LABORATORY   (United States)

Author keywords

Carbon nanotubes; Conductivity; Doping; Electrical properties; Optical properties; Photovoltaic; Separation; Thin films

Indexed keywords

ARSENIC COMPOUNDS; CARBON FILMS; CARBON NANOTUBES; CARRIER COMMUNICATION; CIVIL AVIATION; ELECTRIC CONDUCTIVITY; ELECTRIC PROPERTIES; ELECTRONIC STRUCTURE; HEALTH; METALS; NANOCOMPOSITES; NANOPORES; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOTECHNOLOGY; NANOTUBES; SEMICONDUCTING FILMS; SEMICONDUCTOR JUNCTIONS; SEMICONDUCTOR MATERIALS; SINGLE-WALLED CARBON NANOTUBES (SWCN); THICK FILMS; TUBES (COMPONENTS);

AMERICAN CHEMICAL SOCIETY (ACS); CARRIER DENSITY; METALLIC NANOTUBES; OPTICAL AND ELECTRICAL PROPERTIES; SINGLE WALL CARBON NANOTUBES (SWCNTS); SINGLE-WALLED CARBON NANOTUBE (SWNT) NETWORKS; TRANSMISSION PROBABILITIES; TRANSPARENT CONDUCTIVE FILM (TCF);

CONDUCTIVE FILMS;

CARBON NANOTUBE; METAL;

ARTICLE; CHEMICAL MODEL; CHEMICAL STRUCTURE; CHEMISTRY; COMPUTER SIMULATION; CONFORMATION; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; REFRACTOMETRY; SEMICONDUCTOR; SURFACE PROPERTY; ULTRASTRUCTURE;

COMPUTER SIMULATION; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; METALS; MODELS, CHEMICAL; MODELS, MOLECULAR; MOLECULAR CONFORMATION; NANOTECHNOLOGY; NANOTUBES, CARBON; PARTICLE SIZE; REFRACTOMETRY; SEMICONDUCTORS; SURFACE PROPERTIES;

EID: 47649085054     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn800200d     Document Type: Article

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