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Volumn 6, Issue 4, 2006, Pages 677-682
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Design criteria for transparent single-wall carbon nanotube thin-film transistors
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Author keywords
[No Author keywords available]
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Indexed keywords
METALLIC TUBES;
PERCOLATION THRESHOLD;
SINGLE-WALL CARBON NANOTUBE;
SINGLE-WALL CARBON NANOTUBE THIN-FILM TRANSISTORS;
CARBON NANOTUBES;
CONCENTRATION (PROCESS);
ELECTRON TUNNELING;
PERCOLATION (SOLID STATE);
TRANSPARENCY;
THIN FILM TRANSISTORS;
CARBON NANOTUBE;
ARTICLE;
CHEMICAL MODEL;
CHEMISTRY;
COMPUTER AIDED DESIGN;
COMPUTER SIMULATION;
CRYSTALLIZATION;
ELECTRIC CONDUCTIVITY;
ELECTROCHEMISTRY;
EQUIPMENT;
EQUIPMENT DESIGN;
EVALUATION;
INSTRUMENTATION;
MATERIALS TESTING;
METHODOLOGY;
NANOTECHNOLOGY;
PARTICLE SIZE;
SEMICONDUCTOR;
ULTRASTRUCTURE;
COMPUTER SIMULATION;
COMPUTER-AIDED DESIGN;
CRYSTALLIZATION;
ELECTRIC CONDUCTIVITY;
ELECTROCHEMISTRY;
EQUIPMENT DESIGN;
EQUIPMENT FAILURE ANALYSIS;
MATERIALS TESTING;
MODELS, CHEMICAL;
NANOTECHNOLOGY;
NANOTUBES, CARBON;
PARTICLE SIZE;
TRANSISTORS;
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EID: 33646401537
PISSN: 15306984
EISSN: None
Source Type: Journal
DOI: 10.1021/nl052406l Document Type: Article |
Times cited : (157)
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References (16)
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