Imaging techniques for the analysis of silicon wafers and solar cells

ECS Transactions

Volumn 16, Issue 6, 2009, Pages 63-78

  Bothe, K ^a   Ramspeck, K ^a   Hinken, D ^a   Brendel, R ^a  

^a INSTITUTE FOR SOLAR ENERGY RESEARCH HAMELIN ISFH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER LIFETIME; NANOCRYSTALLINE MATERIALS; SILICON SOLAR CELLS; THERMOGRAPHY (IMAGING);

CHARACTERIZATION TOOLS; HIGH SPATIAL RESOLUTION; LARGE AREA DEVICES; LOCKIN THERMOGRAPHY; LUMINESCENCE IMAGING; MATERIAL PARAMETER; MULTI-CRYSTALLINE SILICON; SPATIAL ANALYSIS;

SILICON WAFERS;

EID: 64149100121     PISSN: 19385862     EISSN: 19386737     Source Type: Conference Proceeding    
DOI: 10.1149/1.2980293     Document Type: Conference Paper

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