Carrier density imaging (CDI): A spatially resolved lifetime measurement suitable for in-line process-control

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2002, Pages 266-269

  Isenberg, J ^a   Riepe, S ^a   Glunz, S W ^a   Warta, W ^a  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING SYSTEMS; LIGHT ABSORPTION; PROCESS CONTROL; SILICON WAFERS; SPATIAL VARIABLES MEASUREMENT; SURFACE TREATMENT;

CARRIER DENSITY IMAGING; IN LINE PROCESS CONTROL; LIFETIME MEASUREMENT;

SOLAR CELLS;

EID: 0036956794     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

1. M. Bail, et al., Proceedings 28th IEEE-PVSC, Anchorage (2000) p. 99-103
2. CMT 384 Lock-In System Documentation, Thermosensorik GmbH, Erlangen, Germany (2000)
3. S. Riepe, J. Isenberg, C. Ballif, S.W. Glunz, W. Warta, Proceedings 17th EU-PVSEC, Munich (2001) in print
4. W. Cabanski, AEG Infrarot-Module-GmbH, Heilbronn (1999)
5. R.A. Sinton, A. Cuevas, M. Stuckings, Proceedings 25th IEEE-PVSC, Washington, (1996), p.457-460.
6. G. Coletti, S. De Iuliis, F. Ferrazza, Proceedings 17th EU-PVSEC, Munich (2001), in print
7. J. Isenberg, J. Dicker, S. Riepe, C. Ballif, S. Peters, H. Lautenschlager, R. Schindler, W. Warta, this conference, in print
8. O. Breitenstein, MPI Halle, Germany, personal communication. (2002)
9. O. Breitenstein, M. Langenkamp, F. Altmann, D. Katzer, A. Lindner, H. Eggers, Rev. Sci. Instr. 71 (2000), p. 4155-4160
10. J. Isenberg, J. Dicker, W. Warta, Proceedings 17th EU-PVSEC, Munich in print