Series resistance imaging in solar cells by lock-in thermography

Progress in Photovoltaics: Research and Applications

Volumn 13, Issue 8, 2005, Pages 645-660

  Breitenstein, O ^a   Rakotoniaina, J P ^a   Van Der Heide, A S H ^b   Carstensen, J ^c  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b TNO   (Netherlands)

^c UNIVERSITY OF KIEL   (Germany)

Author keywords

Lock in thermography; Series resistance; Silicon solar cells

Indexed keywords

DIFFERENCE EQUATIONS; MATHEMATICAL MODELS; THERMOGRAPHY (IMAGING);

LOCK-IN THERMOGRAPHY; SERIES RESISTANCE;

SILICON SOLAR CELLS;

EID: 29044443046     PISSN: 10627995     EISSN: None     Source Type: Journal    
DOI: 10.1002/pip.623     Document Type: Article

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