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Volumn 95, Issue 3, 2009, Pages 673-680
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The influence of hard-baking temperature applied for SU8 sensor layer on the sensitivity of capacitive chemical sensor
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Author keywords
[No Author keywords available]
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Indexed keywords
BAKING PROCESS;
BAKING TEMPERATURES;
CHEMICAL STRUCTURES;
CMOS TECHNOLOGIES;
CROSS-LINKED STRUCTURES;
DEGRADATION TEMPERATURES;
FOURIER-TRANSFORM INFRARED SPECTROSCOPIES;
SENSOR LAYERS;
TEMPERATURE-DEPENDENT CHANGES;
UV PHOTOSENSITIVE;
CHEMICAL SENSORS;
CMOS INTEGRATED CIRCUITS;
CROSSLINKING;
DEGRADATION;
FOURIER TRANSFORMS;
INFRARED SPECTROSCOPY;
SPECTROSCOPIC ANALYSIS;
VOLATILE ORGANIC COMPOUNDS;
CHEMICAL COMPOUNDS;
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EID: 63949083632
PISSN: 09478396
EISSN: 14320630
Source Type: Journal
DOI: 10.1007/s00339-008-4966-4 Document Type: Article |
Times cited : (29)
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References (33)
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