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Volumn 80, Issue 8, 2002, Pages 1438-1440

Shape preservation of Ge/Si(001) islands during Si capping

Author keywords

[No Author keywords available]

Indexed keywords

CAPPING PROCESS; LOW TEMPERATURES; SHAPE CHANGE; SHAPE PRESERVATION; SI CAPPING; SI SURFACES; STRAINED-GE;

SCANNING TUNNELING MICROSCOPY; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 79955989928 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1453476 Document Type: Article

Times cited : (72)

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