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Volumn 77, Issue 4, 2008, Pages

Alloying in Ge (Si) /Si (001) self-assembled islands during their growth and capping: XPS and AFM study

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Indexed keywords


EID: 38849145599     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.77.045431     Document Type: Article
Times cited : (11)

References (28)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.