An analytical model for current crowding and source contact resistance in top-contact organic thin-film transistors

Semiconductor Science and Technology

Volumn 23, Issue 12, 2008, Pages

  Islam, M Nurul ^a   Mazhari, B ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL SENSORS; COMPUTER SIMULATION; CONTACT RESISTANCE; MATHEMATICAL MODELS; SEMICONDUCTING ORGANIC COMPOUNDS; THIN FILM DEVICES; THIN FILM TRANSISTORS;

2D NUMERICAL SIMULATIONS; ANALYTICAL EXPRESSIONS; ANALYTICAL MODELS; AND GATES; CURRENT CROWDING; CURRENT FLOWS; IN FIELDS; SEMI-CONDUCTORS; SIMULATION RESULTS; SOURCE RESISTANCES; SOURCE VOLTAGES; STRUCTURAL PARAMETERS;

TRANSISTORS;

EID: 58149459317     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/23/12/125027     Document Type: Article

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