Film and contact resistance in pentacene thin-film transistors: Dependence on film thickness, electrode geometry, and correlation with hole mobility

Journal of Applied Physics

Volumn 99, Issue 9, 2006, Pages

  Pesavento, Paul V ^a   Puntambekar, Kanan P ^a   Frisbie, C Daniel ^a   McKeen, John C ^a   Ruden, P Paul ^a  

^a University of Minnesota   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT RESISTANCE; DIELECTRIC/GATE ELECTRODE ASSEMBLIES; GATED FOUR-PROBE TECHNIQUE; PENTACENE ORGANIC THIN-FILM TRANSISTORS;

COMPUTATIONAL GEOMETRY; CONDITION MONITORING; CORRELATION THEORY; DIELECTRIC DEVICES; ELECTRIC RESISTANCE; ELECTRODES; GOLD; HOLE MOBILITY; MEASUREMENT THEORY; VOLTAGE DISTRIBUTION MEASUREMENT;

THIN FILM TRANSISTORS;

EID: 33646861680     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2197033     Document Type: Article

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