Diffraction analysis of elastic strains in micro and nanostructures

Zeitschrift fur Kristallographie

Volumn 223, Issue 9, 2008, Pages 569-574

  Thomas, Olivier ^a,b  

^a AIX MARSEILLE UNIVERSITÉ   (France)

^b CNRS   (France)

Author keywords

Coherent diffraction; Microdiffraction; Nanoobjects; Strain; Stress; Thin film

Indexed keywords

EID: 58149335496     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: 10.1524/zkri.2008.1215     Document Type: Conference Paper

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