X-ray structure investigation of lateral surface nanostructures-a full quantitative analysis of non-uniform lattice strain

Journal of Physics D: Applied Physics

Volumn 32, Issue 10 A, 1999, Pages

  Baumbach, G T ^a,b   Lubbert D ^b,d   Gallhanou, M ^c  

^a FRAUNHOFER INSTITUTE FOR NON DESTRUCTIVE TESTING   (Germany)

^b SAARLAND UNIVERSITY   (Germany)

^c UNIVERSITÉ PARIS SACLAY   (France)

^d EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CONTINUUM MECHANICS; DIFFRACTION GRATINGS; INTERFACES (MATERIALS); SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTING INDIUM PHOSPHIDE; STRAIN; STRESS RELAXATION; SURFACES; X RAY DIFFRACTION;

LATERAL SURFACE NANOSTRUCTURES; NONUNIFORM LATTICE STRAIN; STRAIN RELAXATION; SURFACE PATTERNING; X RAY DIFFRACTION RECIPROCAL SPACE MAPPING; X RAY STRUCTURE;

CRYSTAL LATTICES;

EID: 0345102466     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/10A/340     Document Type: Article

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