Nondestructive three-dimensional characterization of grain boundaries by X-ray crystal microscopy

Ultramicroscopy

Volumn 103, Issue 3, 2005, Pages 199-204

  Liu, Wenjun ^a,b   Ice, Gene E ^a   Larson, Bennett C ^a   Yang, Wenge ^a   Tischler, Jonathan Z ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

20,26; 3d X ray crystal microscopy; Coincident site lattice; Grain boundary characterization

Indexed keywords

CRYSTAL ORIENTATION; MATHEMATICAL MODELS; MORPHOLOGY; OPTICAL RESOLVING POWER; POLYCRYSTALLINE MATERIALS; SENSITIVITY ANALYSIS; X RAY ANALYSIS;

COINCIDENT SITE LATTICE (CSL) MODELS; CRYSTALLOGRAPHIC ORIENTATIONS; DIFFERENTIAL APERTURE; X-RAY CRYSTAL MICROSCOPY;

GRAIN BOUNDARIES;

ARTICLE; MICROSCOPY; MODEL; MORPHOLOGY; STRUCTURE ANALYSIS; X RAY CRYSTAL MICROSCOPY; X RAY CRYSTALLOGRAPHY;

EID: 17844378940     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2004.11.022     Document Type: Article

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