Elastic modulus of polypyrrole nanotubes

Physical Review Letters

Volumn 85, Issue 8, 2000, Pages 1690-1693

  Cuenot, Stéphane ^a   Demoustier Champagne, Sophie ^a   Nysten, Bernard ^a  

^a UNIVERSITÉ CATHOLIQUE DE LOUVAIN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BENDING (DEFORMATION); ELASTIC MODULI; FORCE MEASUREMENT; PLASTIC DEFORMATION; PLASTIC FILMS; POLYPYRROLES; SCANNING ELECTRON MICROSCOPY; SECONDARY ION MASS SPECTROMETRY; TENSILE TESTING; THIN FILMS;

TIME-OF-FLIGHT SECONDARY ION MASS SPECTROSCOPY (TOF-SIMS);

NANOTUBES;

EID: 0034248595     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.85.1690     Document Type: Article

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