Theoretical modelling and implementation of elastic modulus measurement at the nanoscale using atomic force microscope

Journal of Physics: Conference Series

Volumn 61, Issue 1, 2007, Pages 1303-1307

  Belikov, Sergey ^a   Magonov, Sergei ^a   Erina, Natalia ^a   Huang, Lin ^a   Su, Chanmin ^a   Rice, Alan ^a   Meyer, Charles ^a   Prater, Craig ^a   Ginzburg, Valeriy ^b   Meyers, Gregory ^b   McIntyre, Robert ^b   Lakrout, Hamed ^b  

^a VEECO INSTRUMENTS INC   (United States)

^b DOW CHEMICAL COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34247488846     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/61/1/257     Document Type: Article

References (8)

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2. Such probes were made by WC coating of etched Si probes (http://www.team-nanotec.de/)
3. Hutter L and Bechhoefer J 1993 Rev. Sci. Inst. 64 1868
4. Sneddon I N 1965 Int. J. Eng. Sci. 3 47
5. Oliver W C and Pharr G M 2004 J. Mater. Res. 19 3
6. Pharr G M, Oliver W C and Brotzen F R 1992 J. Mater. Res. 7 613
7. Maugis D 2000 Contact, adhesion and rupture of elastic solid (Springer, Heidelberg)
8. Hay J C, Bolshakov A, Pharr G M 1999 J. Mater. Res. 14 2296