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Volumn , Issue , 2008, Pages 529-536

Evaluation of voltage interpolation to address process variations

Author keywords

[No Author keywords available]

Indexed keywords

ADVANCED FABRICATIONS; CIRCUIT TUNING; DELAY OVERHEADS; DESIGN APPROACHES; DESIGN BLOCKS; DESIGN CONSIDERATIONS; DESIGN PROCESSES; DESIGN TRADEOFFS; MULTIPROCESSOR MACHINES; POSTFABRICATION TUNING; POWER BUDGETS; POWER COSTS; POWER OVERHEADS; PROCESS VARIATIONS; STATIC POWERS;

EID: 57849167898     PISSN: 10923152     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCAD.2008.4681626     Document Type: Conference Paper
Times cited : (4)

References (18)
  • 1
    • 34247153506 scopus 로고    scopus 로고
    • Post silicon power/performance optimization in the presence of process variations using individual well-adaptive body biasing
    • March
    • J. Gregg and T. Chen, "Post silicon power/performance optimization in the presence of process variations using individual well-adaptive body biasing," IEEE Transactions on Very Large Scale Integration (VLSI) Systems, March 2007.
    • (2007) IEEE Transactions on Very Large Scale Integration (VLSI) Systems
    • Gregg, J.1    Chen, T.2
  • 2
    • 0036858210 scopus 로고    scopus 로고
    • Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage
    • November
    • J. W. Tschanz, J. T. Kao, and S. G. Narendra, "Adaptive body bias for reducing impacts of die-to-die and within-die parameter variations on microprocessor frequency and leakage," IEEE Journal of Solid-State Circuits, November 2002.
    • (2002) IEEE Journal of Solid-State Circuits
    • Tschanz, J.W.1    Kao, J.T.2    Narendra, S.G.3
  • 3
    • 49549096924 scopus 로고    scopus 로고
    • A process-variation-tolerant oating-point unit with voltage interpolation and variable latency
    • Feb
    • X. Liang, D. Brooks, and G.-Y. Wei, "A process-variation-tolerant oating-point unit with voltage interpolation and variable latency," in International Solid-State Circuits Conference, Feb. 2008.
    • (2008) International Solid-State Circuits Conference
    • Liang, X.1    Brooks, D.2    Wei, G.-Y.3
  • 6
    • 47649084398 scopus 로고    scopus 로고
    • Statistical leakage and timing optimization for submicron process variation
    • January
    • Y. Lu and V. D. Agrawal, "Statistical leakage and timing optimization for submicron process variation," in 20th International Conference on VLSI Design, January 2007.
    • (2007) 20th International Conference on VLSI Design
    • Lu, Y.1    Agrawal, V.D.2
  • 8
    • 33846261495 scopus 로고    scopus 로고
    • A. Srivastava, T. Kachru, and D. Sylvester, Low-power-design space exploration considering process variation using robust optimization, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 26, no. 1, pp. 67.79, 2007.
    • A. Srivastava, T. Kachru, and D. Sylvester, "Low-power-design space exploration considering process variation using robust optimization," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 26, no. 1, pp. 67.79, 2007.
  • 9
    • 33750594762 scopus 로고    scopus 로고
    • D. Sinha, N. V. Shenoy, and H. Zhou, Statistical timing yield optimization by gate sizing, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 14, no. 10, pp. 1140.1146, October 2006.
    • D. Sinha, N. V. Shenoy, and H. Zhou, "Statistical timing yield optimization by gate sizing," IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 14, no. 10, pp. 1140.1146, October 2006.
  • 11
    • 46149117523 scopus 로고    scopus 로고
    • Joint design-time and postsilicon minimization of parametric yield loss using adjustable robust optimization
    • November
    • M. Mani, A. Singh, and M. Orshansky, "Joint design-time and postsilicon minimization of parametric yield loss using adjustable robust optimization," in IEEE/ACM International Conference on Computer Aided Design, November 2006.
    • (2006) IEEE/ACM International Conference on Computer Aided Design
    • Mani, M.1    Singh, A.2    Orshansky, M.3
  • 17
    • 57849098983 scopus 로고    scopus 로고
    • Faraday Technology Corporation
    • Faraday Technology Corporation, "UMC 0.13um Logic core cell library," http://www.faraday-tech.com/.
    • UMC 0.13um Logic core cell library


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.