Precision cutting of nanotubes with a low-energy electron beam

Applied Physics Letters

Volumn 86, Issue 5, 2005, Pages 1-3

  Yuzvinsky, T D ^a   Fennimore, A M ^a   Mickelson, W ^a   Esquivias, C ^a   Zettl, A ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON-TRANSPARENT SUBSTRATE; LOW-ENERGY ELECTRON BEAMS; NANOTUBE CUTTING; TURBULENT DEPOSITION;

ATOMIC FORCE MICROSCOPY; CUTTING; DEPOSITION; ELECTRON BEAM LITHOGRAPHY; ELECTRON BEAMS; ELECTRON ENERGY LEVELS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

NANOTUBES;

EID: 21044449460     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1857081     Document Type: Article

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