Carbon nanotube tips for a scanning probe microscope: Their fabrication and properties

Journal of Physics D: Applied Physics

Volumn 32, Issue 9, 1999, Pages 1044-1048

  Akita, Seijl ^a   Nishijima, Hidehiro ^a   Nakayama, Yoshikazu ^a   Tokumasu, Fuyuki ^b   Takeyasu, Kunio ^b  

^a Osaka Prefecture University   (Japan)

^b KYOTO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; ELASTIC MODULI; ELECTRODEPOSITION; ELECTRON BEAMS; ELECTROPHORESIS; PURIFICATION; SCANNING ELECTRON MICROSCOPY;

SCANNING PROBE MICROSCOPY (SPM);

NANOTUBES;

EID: 0032675094     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/32/9/316     Document Type: Article

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