Electronic current transport through molecular monolayers: Comparison between Hg/alkoxy and alkyl monolayer/Si(100) junctions

Advanced Materials

Volumn 20, Issue 20, 2008, Pages 3931-3936

  Thieblemont, Florent ^a   Seitz, Oliver ^a   Vilan, Ayelet ^a   Cohen, Hagai ^a   Salomon, Eric ^b   Kahn, Antoine ^b   Cahen, David ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

^b Princeton University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALKYLATION; ANGLE MEASUREMENT; ATOMIC PHYSICS; ATOMIC SPECTROSCOPY; ATOMS; BINDING ENERGY; CONTACT ANGLE; ELECTROLYSIS; ELECTRON ENERGY LEVELS; MERCURY (METAL); MOLECULAR SPECTROSCOPY; MONOLAYERS; PHOTOELECTRON SPECTROSCOPY; SILICON; SILICON SOLAR CELLS; SINGLE CRYSTALS;

ALKYL CHAINS; ATOMIC FORCES; C ATOMS; ELECTRONIC CURRENTS; FREE SI; MEAN FREE PATHS; MOLECULAR LENGTHS; MOLECULAR MONOLAYERS; MONOLAYER THICKNESSES; POLARIZED IR SPECTRUMS; SURFACE NORMALS; TILT ANGLES; X-RAY PHOTOELECTRON SPECTROSCOPIES;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 55749099488     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200800659     Document Type: Article

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