SDRAM architecture & Single Event Effects revealed with laser

Proceedings - 14th IEEE International On-Line Testing Symposium, IOLTS 2008

Volumn , Issue , 2008, Pages 283-288

  Bougerol, A ^a   Miller, F ^a   Buard, N ^a  

^a AIRBUS GROUP INNOVATIONS   (Germany)

Author keywords

Laser; SDRAM; SEFI; Single event effect

Indexed keywords

COSMOLOGY; DYNAMIC RANDOM ACCESS STORAGE; LASERS; LITHOGRAPHY; PULSED LASER APPLICATIONS; PULSED LASER DEPOSITION;

CELL LEVELS; COSMIC RADIATIONS; CROSS SECTIONING; LASER; LITHOGRAPHY PROCESSES; MEMORY ARRAYS; ON-LINE TESTING; PARTICLE ACCELERATORS; POW ERFUL TOOL; PULSED LASERS; SDRAM; SEFI; SINGLE EVENT EFFECT; SINGLE-EVENT EFFECTS; TECHNOLOGICAL PARAMETERS;

LASER BEAM EFFECTS;

EID: 52049098878     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IOLTS.2008.40     Document Type: Conference Paper

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