Application of laser testing in study of SEE mechanisms in 16-Mbit DRAMs

IEEE Transactions on Nuclear Science

Volumn 47, Issue 6 III, 2000, Pages 2392-2399

  Duzellier, Sophie ^a   Falguère, Didier ^a   Guibert, Laurent ^a   Pouget, Vincent ^b   Fouillat, Pascal ^b   Ecoffet, Robert ^c  

^a ONERA   (France)

^b UNIVERSITÉ BORDEAUX 1   (France)

^c CNES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC RANDOM ACCESS STORAGE; HEAVY IONS; LASER APPLICATIONS; LASER BEAMS;

LASER TESTING; SINGLE EVENT EFFECT MECHANISM;

RADIATION EFFECTS;

EID: 0034451169     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.903782     Document Type: Conference Paper

References (19)

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