Cosmic ray soft error rates of 16-Mb DRAM memory chips

IEEE Journal of Solid-State Circuits

Volumn 33, Issue 2, 1998, Pages 246-251

  Ziegler, James F ^a,b,f,g,h   Nelson, Martin E ^c,i,j,k,l,m   Shell, James Dean ^c,k,n,o   Peterson, R Jerry ^d,h,l,p,q   Gelderloos, Carl J ^d   Muhlfeld, Hans P ^e   Montrose, Charles J ^e  

^a IEEE   (United States)

^b IBM RESEARCH   (United States)

^c UNITED STATES NAVAL ACADEMY   (United States)

^d UNIVERSITY OF COLORADO   (United States)

^e IBM MICROELECTRONICS   (United States)

^f YALE UNIVERSITY   (United States)

^g IBM   (United States)

^h AMERICAN PHYSICAL SOCIETY   (United States)

ⁱ UNIVERSITY OF WISCONSIN MADISON   (United States)

^j UNIVERSITY OF VIRGINIA   (United States)

^k UNIVERSITY OF MARYLAND   (United States)

^l Nucl Eng/Mat Science Department ^*

^m Health Physics Society   (United States)

ⁿ Space and Naval Warfare Systems Center Pacific   (United States)

^o University of Washington   (United States)

^p UNIVERSITY OF WASHINGTON   (United States)

^q PAKISTAN ACADEMY OF SCIENCES   (Pakistan)

more..

Author keywords

Aircraft computers; Error analysis; Integrated circuit design; Integrated circuit measurements; Integrated circuit reliability; Memory fault diagnosis; Memory testing; Particle beams

Indexed keywords

CAPACITOR STORAGE; CAPACITORS; DESIGN; INTEGRATED CIRCUITS; PARTICLE BEAMS; TECHNOLOGY; TESTING;

MEMORY FAULT DIAGNOSIS;

DATA STORAGE EQUIPMENT;

EID: 0031996751     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/4.658626     Document Type: Article

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