An overview of radiation single event effects testing of advanced memory components

European Space Agency, (Special Publication) ESA SP

Volumn , Issue 507, 2002, Pages 239-246

  Harboe Sorensen R ^a  

^a EUROPEAN SPACE AGENCY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL INTEGRATED CIRCUITS; ELECTRONICS INDUSTRY; ELECTRONICS PACKAGING; INTEGRATED CIRCUIT LAYOUT; LIFE CYCLE; RADIATION EFFECTS; SEMICONDUCTOR STORAGE; SPACE APPLICATIONS;

MICROPACKAGING CONCEPTS; SINGLE EVENT EFFECTS;

INTEGRATED CIRCUIT TESTING;

EID: 0037004132     PISSN: 03796566     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

1. R. Harboe Sørensen, R. Müller, E. Daly, B. Nickson, J. Schmitt and F.J. Rombeck, "Radiation Pre-screening of 4-Mbit Dynamic Random Access Memories for Space Applications", RADECS'91, La Grande-Motte, France, Sep. 1991, pp 489-504.
2. R. Harboe Sørensen, P. Vuilleumier, L. Adams, B. Nickson and R. Müller, "Radiation Testing of Flight Lots for MARS-94 Covering - Semiconductor Types as 4-Mbit DRAM, 256-Kbit SRAM, 256-Kbit EEPROM and a 53C90 SCSI Controller", RADECS'93, Saint-Malo, France, Sep. 1993, pp 490-98.
3. R. Harboe Sørensen, R. Müller, and S. Fraenkel, "Heavy ion, Proton and Co-60 Radiation Evaluation of 16-Mbit DRAM Memories for Space Application", IEEE NSREC'95, Workshop Record, pp 42-49
4. R. Harboe Sørensen, M. Bruggemann, R. Müller, and F.J. Rombeck, "Radiation Evaluation of 3.3 Volt 16 M-bit DRAMs for Solid State Mass Memory Applications", IEEE NSREC'98, Workshop Record, pp 74-79.
5. G. Berger, G. Ryckewaert, R. Harboe Sørensen and L. Adams, "The Heavy Ion Irradiation Facility at CYCLONE - A Dedicated SEE Beam Line", NSREC'96, Indian Wells, California, 1996.
6. A. Virtanen, J. Hyvonen, K. Ranttila, I. Rekikoski and J. Tuppurainen, "Heavy Ion and Proton Test Site at JYFL-Accelerator Laboratory", Nucl. Instr. & Meth. A426, 1999, pp 68-71.
7. M. A. McMahan, "Radiation Effects Testing at the 88-Inch Cyclotron", RADECS'99, Fontevraud, France, Sep. 1999, pp 142-147.
8. R. Koga, S. H. Crain, P. Yu and K. B. Crawford, "SEE Sensitivity Determination of High-Density DRAMs with Limited-Range Heavy Ions", IEEE NSREC'01, Workshop Record, pp 182-89.
9. S. Duzellier, D. Falguere, T. Nuns, F. Bezerra and J. Bertrand, "Observation of the SEE Response of a 256-Mb SDRAM", Paper presented at the RADECS 2002 Workshop, Padova, Italy. Sep. 20, 2002.