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Volumn , Issue , 2007, Pages 141-145

Results of recent 14 MeV neutron single event effects measurements conducted by the Jet Propulsion Laboratory

Author keywords

[No Author keywords available]

Indexed keywords

FLASH MEMORY; INTERNAL COMBUSTION ENGINES; NASA; NEUTRONS; OPERATIONAL AMPLIFIERS; OPTOELECTRONIC DEVICES; RADIATION;

EID: 47849108196     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2007.4342555     Document Type: Conference Paper
Times cited : (18)

References (13)
  • 1
    • 0032313960 scopus 로고    scopus 로고
    • Extensions of the Burst Generation Rate Method for Wider Application to Proton/Neutron-Induced Single Event Effects
    • E. Normand, "Extensions of the Burst Generation Rate Method for Wider Application to Proton/Neutron-Induced Single Event Effects," IEEE Trans. Nuc. Sci., 45, 2904, 1998.
    • (1998) IEEE Trans. Nuc. Sci , vol.45 , pp. 2904
    • Normand, E.1
  • 2
    • 8344278142 scopus 로고    scopus 로고
    • An Experimental Study of Single Event Effects Induced in Commercial SRAMS by Neutrons and Protons from Thermal Energies to 500 MeV
    • C. Dyer et al., "An Experimental Study of Single Event Effects Induced in Commercial SRAMS by Neutrons and Protons from Thermal Energies to 500 MeV," IEEE Trans. Nucl. Sci., 51, 2817-2824, 2004.
    • (2004) IEEE Trans. Nucl. Sci , vol.51 , pp. 2817-2824
    • Dyer, C.1
  • 3
    • 11044227167 scopus 로고    scopus 로고
    • Analysis of Proton/Neutron SEU Sensitivity of Commercial SRAMs-Pllication to the Terrestrial Environment test Method
    • J. Baggio, V. Ferlet-Cavrois, H. Duarte, and O. Flament, "Analysis of Proton/Neutron SEU Sensitivity of Commercial SRAMs-Pllication to the Terrestrial Environment test Method," IEEE Trans. Nucl. Sci., 51(6), 3420-3426, 2004.
    • (2004) IEEE Trans. Nucl. Sci , vol.51 , Issue.6 , pp. 3420-3426
    • Baggio, J.1    Ferlet-Cavrois, V.2    Duarte, H.3    Flament, O.4
  • 4
    • 0027576605 scopus 로고
    • Single Event Upset in Avionics
    • A. Taber, and E. Normand, "Single Event Upset in Avionics," IEEE Trans. Nucl. Sci., 40(2), 120-126, 1993.
    • (1993) IEEE Trans. Nucl. Sci , vol.40 , Issue.2 , pp. 120-126
    • Taber, A.1    Normand, E.2
  • 5
    • 0035723344 scopus 로고    scopus 로고
    • Correlation of In-flight Neutron Dosimeter and SEU Measurements with Atmospheric Neutron Model
    • E. Normand, "Correlation of In-flight Neutron Dosimeter and SEU Measurements with Atmospheric Neutron Model," IEEE Trans. Nucl. Sci, 48, 1996, 2001.
    • (2001) IEEE Trans. Nucl. Sci , vol.48 , pp. 1996
    • Normand, E.1
  • 6
    • 33144472876 scopus 로고    scopus 로고
    • Catastrophic latchup in a CMOS operational amplifier
    • F. Irom, and T. F. Miyahira, "Catastrophic latchup in a CMOS operational amplifier," IEEE Trans. Nucl. Sci., 52(6), pp. 2475-2480, 2005.
    • (2005) IEEE Trans. Nucl. Sci , vol.52 , Issue.6 , pp. 2475-2480
    • Irom, F.1    Miyahira, T.F.2
  • 7
    • 33749413701 scopus 로고    scopus 로고
    • Test results of single-event effects conducted by the Jet Propulsion Laboratory
    • F. Irom, and T. F. Miyahira, "Test results of single-event effects conducted by the Jet Propulsion Laboratory," Radiation Effects Data Workshop, pp 36- 41, 2005.
    • (2005) Radiation Effects Data Workshop , pp. 36-41
    • Irom, F.1    Miyahira, T.F.2
  • 10
    • 47849110041 scopus 로고    scopus 로고
    • Single Event Effects measurements of NAND Flashes for MSL Project
    • F. Irom, and D. N. Nguyen, "Single Event Effects measurements of NAND Flashes for MSL Project," 2007.
    • (2007)
    • Irom, F.1    Nguyen, D.N.2
  • 12
    • 47849090178 scopus 로고    scopus 로고
    • Aeroflex Data sheet
    • Aeroflex Data sheet.
  • 13
    • 33846305726 scopus 로고    scopus 로고
    • Single-Event Upset and Scaling Trends in New Generation of the Commercial SOI PowerPC Microprocessors
    • F. Irom, F.F. Farmanesh, and C. K. Kouba, "Single-Event Upset and Scaling Trends in New Generation of the Commercial SOI PowerPC Microprocessors," IEEE Trans. Nucl. Sci. 53(6), pp. 3563-3574, 2006.
    • (2006) IEEE Trans. Nucl. Sci , vol.53 , Issue.6 , pp. 3563-3574
    • Irom, F.1    Farmanesh, F.F.2    Kouba, C.K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.