Single-event effects test results of 512MB SDRAMs

IEEE Radiation Effects Data Workshop

Volumn 2003-January, Issue , 2003, Pages 98-101

  Langley, T ^a   Koga, R ^b   Morris, T ^a  

^a SEAKR ENGINEERING INC   (United States)

^b AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

RADIATION HARDENING;

FEASIBILITY ASSESSMENT; RADIATION TESTS; SINGLE EVENT; SINGLE EVENT EFFECTS; SINGLE EVENT LATCH-UP; SINGLE EVENT UPSETS;

RADIATION EFFECTS;

EID: 47849085024     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/REDW.2003.1281355     Document Type: Conference Paper

References (4)

1. R. Koga, S. H. Crain, P. Yu, K. B. Crawford, "SEE Sensitivity Determination of High-Density DRAMs with Limited-Range Heavy Ions," IEEE Radiation Effects Data Workshop, pp. 182-189, 2001.
2. J. Barth, "Modelng Space Radiation Environments," IEEE Nuclear Space Radiation Effects Conference Short Course, Section I pp. 1-83, 1997.
3. E. Petersen, "Single-Event Analysis and Prediction," IEEE Nuclear Space Radiation Effects Conference Short Course, Section III p. 59, 1997.
4. Andrew Holmes-Siedle, Len Adams, Handbook of Radiation Effects, 2rd ed. Oxford University Press, 2002, p. 106.