Dynamic SDRAM SEFI detection and recovery test results

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2004, Pages 62-67

  Guertin, Steven M ^a   Patterson, Jeffrey D ^a   Nguyen, Duc N ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Radiation Effects; SDRAM; SEFI; SEU

Indexed keywords

MITIGATION SYSTEMS; SDRAM; SEU; SINGLE EVENT FUNCTIONALITY INTERRUPT (SEFI);

ALGORITHMS; COMPUTER ARCHITECTURE; DATA REDUCTION; DATA STORAGE EQUIPMENT; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; RADIATION; RADIATION EFFECTS; ROBUSTNESS (CONTROL SYSTEMS);

RANDOM ACCESS STORAGE;

EID: 17644419059     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

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3. R. Harboe-Sorensen, R. Muller, S. Fraenkel, "Heavy Ion, Proton, and Co-60 Radiation Evaluation of 16 Mbit DRAM Memories for Space Application", IEEE NSREC Data Workshop, pp. 42-49, 1995.
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5. R. Koga, P. Yu, K. B. Crawford, S. H. Crain, V. T. Tran, "Permanent Single Event Functional Interrupts (SEFIs) in 128- and 256- Megabit Synchronous Dynamic Random Access Memories (SDRAMs)", IEEE NSREC Data Workshop, pp. 6-13, 2001.
6. J. Rodgers, Email Communication, September 2003, Unpublished.