Permanent Single Event Functional Interrupts (SEFIs) in 128- and 256-megabit Synchronous Dynamic Random Access Memories (SDRAMs)

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2001, Pages 6-13

  Koga, R ^a   Yu, P ^a   Crawford, K B ^a   Crain, S H ^a   Tran, V T ^a  

^a AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTROL EQUIPMENT; FORMAL LOGIC; HEAVY IONS; PROTONS; RADIATION;

SYNCHRONOUS DYNAMIC RANDOM ACCESS MEMORIES (SDRAM);

DYNAMIC RANDOM ACCESS STORAGE;

EID: 0035175344     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)

1. Single event functional interrupt (SEFI) sensitivity in microcircuits