A novel multi-point NBTI characterization methodology using smart intermediate stress (SIS)

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2008, Pages 79-86

  Schlünder, Christian ^a   Hoffmann, Marcel ^a   Vollertsen, Rolf Peter ^a   Schindler, Günther ^a   Heinrigs, Wolfgang ^a   Gustin, Wolfgang ^a   Reisinger, Hans ^a  

^a INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

INTERMEDIATE STRESS; MEASUREMENT METHODS; NBTI CHARACTERIZATION; RELIABILITY PHYSICS;

RELIABILITY;

EID: 51549097592     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RELPHY.2008.4558867     Document Type: Conference Paper

References (20)

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