Theory and practice of on-the-fly and ultra-fast VT measurements for NBTI degradation: Challenges and opportunities

Technical Digest - International Electron Devices Meeting, IEDM

Volumn , Issue , 2007, Pages 805-808

  Islam, A E ^a   Kumar, E N ^b   Das, H ^b   Purawat, S ^b   Maheta, V ^b   Aono, H ^c   Murakami, E ^c   Mahapatra, S ^b   Alam, M A ^a  

^a Purdue University   (United States)

^b INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

^c RENESAS TECHNOLOGY CORP   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ON-THE-FLY; ULTRA-FAST;

ELECTRON DEVICES;

EID: 43749083589     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2007.4419070     Document Type: Conference Paper

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