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Volumn 84, Issue 9-10, 2007, Pages 2412-2415
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Modeling HfO2/SiO2/Si interface
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Author keywords
Ab initio; Band alignment; Disorder; High k; Interface
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Indexed keywords
ELECTRONIC STRUCTURE;
ENERGY GAP;
ATOMIC DISORDER;
BAND ALIGNMENT;
NON-EPITAXIAL ATOMIC ARRANGEMENTS;
INTERFACES (MATERIALS);
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EID: 34249041764
PISSN: 01679317
EISSN: None
Source Type: Journal
DOI: 10.1016/j.mee.2007.04.102 Document Type: Article |
Times cited : (28)
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References (18)
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