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Volumn 76, Issue 20, 2000, Pages 2886-2888

Local transport and trapping issues in Al2O3 gate oxide structures

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000632737     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126506     Document Type: Article
Times cited : (107)

References (22)
  • 12
    • 85037521122 scopus 로고    scopus 로고
    • note
    • b, is assumed to occur through field enhanced leakage through the oxide into the gate.
  • 17
    • 85037513995 scopus 로고    scopus 로고
    • note
    • eb arises from the choice alone of the power dependence of the photoresponse.
  • 20
    • 0002452753 scopus 로고
    • edited by E. D. Palik Academic, New York
    • H. R. Philipp, in Handbook of Optical Constants, edited by E. D. Palik (Academic, New York 1985), p. 749.
    • (1985) Handbook of Optical Constants , pp. 749
    • Philipp, H.R.1
  • 21
    • 0000975451 scopus 로고
    • edited by E. D. Palik Academic, New York
    • F. Gervais, in Handbook of Optical Constants II, edited by E. D. Palik (Academic, New York, 1991). p. 761.
    • (1991) Handbook of Optical Constants , vol.2 , pp. 761
    • Gervais, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.