Study of metal-related deep-level defects in germanide Schottky barriers on n-type germanium

Journal of Applied Physics

Volumn 104, Issue 2, 2008, Pages

  Simoen, E ^a   Opsomer, K ^a,c   Claeys, C ^a,c   Maex, K ^a,c   Detavernier, C ^b   Van Meirhaeghe, R L ^b   Clauws, P ^b  

^a IMEC   (Belgium)

^b GHENT UNIVERSITY   (Belgium)

^c UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CHROMIUM; COPPER; COPPER ALLOYS; GERMANIUM; METALLIZING; METALS; PLATINUM; PLATINUM METALS; SCHOTTKY BARRIER DIODES;

ACCEPTOR LEVELS; DEEP LEVELS; DEEP-LEVEL DEFECTS; GERMANIDE; METAL ATOMS; MINORITY CARRIERS; SCHOTTKY BARRIERS; TEMPERATURE RANGES;

DEEP LEVEL TRANSIENT SPECTROSCOPY;

EID: 48949103604     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2956708     Document Type: Article

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