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Volumn 86, Issue 2, 1999, Pages 940-945

Photoinduced current transient spectroscopy of deep defects in n-type ultrapure germanium

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0343913822     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370828     Document Type: Article
Times cited : (10)

References (19)
  • 2
    • 0016081559 scopus 로고
    • D. V. Lang, J. Appl. Phys. 45, 3014 (1974); 45, 3023 (1974).
    • (1974) J. Appl. Phys. , vol.45 , pp. 3023
  • 13
    • 0012851029 scopus 로고
    • P. A. Barnes and G. A. Rozgonyi, eds., PV78-3, The Electrochemical Society, Inc., Princeton, NJ
    • G. M. Martin and B. Bois, in Semiconductor Characterization Techniques, P. A. Barnes and G. A. Rozgonyi, eds., PV78-3, p. 32 (The Electrochemical Society, Inc., Princeton, NJ, 1978).
    • (1978) Semiconductor Characterization Techniques , pp. 32
    • Martin, G.M.1    Bois, B.2
  • 16
    • 85034542598 scopus 로고
    • Ph.D. thesis, Université de Paris VI, Paris
    • D. Pons, Ph.D. thesis, Université de Paris VI, Paris, 1979.
    • (1979)
    • Pons, D.1
  • 17
    • 85034564205 scopus 로고
    • Ph.D. thesis, Universiteit Gent, Gent
    • E. Simoen, Ph.D. thesis, Universiteit Gent, Gent, 1985.
    • (1985)
    • Simoen, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.