Electrical characterization of defects introduced during electron beam deposition of Pd Schottky contacts on n -type Ge

Applied Physics Letters

Volumn 88, Issue 24, 2006, Pages

  Auret, F D ^a   Meyer, W E ^a   Coelho, S ^a   Hayes, M ^a  

^a UNIVERSITY OF PRETORIA   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

DEEP LEVEL TRANSIENT SPECTROSCOPY; DEPOSITION; ELECTRON BEAMS; ELECTRON IRRADIATION; GERMANIUM; PALLADIUM; SCHOTTKY BARRIER DIODES;

CHARGE STATES; HIGH-ENERGY ELECTRON; HIGH-ENERGY PARTICLE IRRADIATION;

CRYSTAL DEFECTS;

EID: 33745187586     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2213203     Document Type: Article

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