Characterization of ITO/CdO/glass thin films evaporated by electron beam technique

Science and Technology of Advanced Materials

Volumn 9, Issue 2, 2008, Pages

  Mohamed, Hussein Abdel Hafez ^a   Ali, Hazem Mahmoud ^a  

^a Sohag University   (Egypt)

Author keywords

Buffer layer; CdO; Electron beam; ITO; Optoelectronic properties; Thin films

Indexed keywords

BUFFER LAYERS; CADMIUM; CADMIUM COMPOUNDS; ELECTRIC PROPERTIES; ELECTRON BEAMS; ELECTRON OPTICS; EPITAXIAL GROWTH; MOLECULAR BEAM EPITAXY; OXIDE FILMS; PARTICLE BEAMS; THICK FILMS; TIN; TITANIUM COMPOUNDS;

BUFFER LAYER; CADMIUM OXIDE; CDO; ELECTRON BEAM; ELECTRON BEAM TECHNIQUE; ELECTRON-BEAM EVAPORATION; HEAT-TREATMENT; INDIUM TIN OXIDE FILMS; ITO; ITO FILMS; OPTICAL AND ELECTRICAL PROPERTIES; OPTOELECTRONIC PROPERTIES; THIN BUFFER; THIN FILMS; VISIBLE REGIONS;

INTEGRATED OPTOELECTRONICS;

EID: 48449105184     PISSN: 14686996     EISSN: None     Source Type: Journal    
DOI: 10.1088/1468-6996/9/2/025016     Document Type: Article

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